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Si dynamic quantum dot single-electron pump for metrology applications

Aalto Quantum Physics Seminars (Hybrid). Dr. Akira Fujiwara (NTT Basic Research Laboratories)


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Abstract: 

A Si quantum dot (QD) devices based on MOSFET technology are promising for metrology and quantum applications. I will talk about our recent work on tunable-barrier QD single-electron (SE) pumps which can operate at GHz frequencies as an accurate current sources with sub-ppm uncertainty. We have developed a device simulator of Si SE pumps, which is a useful tool to verify our experimental observations; we can clarify the optimal design of device structures as well as the significance of controlling electron quantum dynamics and excitation inside the QD. Recent progress of the Japanese quantum metrology triangle (QMT) project, which is aiming at a deep sub-ppm level in collaboration with NMIJ, AIST will be also described.

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